Percorrendo por Autor Letícia Maria Bolzani Pöhls
Mostrando regs. 1 a 5 de 5
Data de publicação | Título | Autor(es) |
2016 | Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID | Juliano Benfica; GREEN, BRUNO; PORCHER, BRUNO C., et al |
2017 | Analyzing the behavior of FinFET SRAMs with resistive defects | COPETTI, THIAGO S.; BALEN, TIAGO R.; MEDEIROS, GUILHERME C., et al |
2015 | Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs | LAVRATTI, F.; Letícia Maria Bolzani Pöhls; Fabian Vargas, et al |
2018 | Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs | MEDEIROS, G.; BRUM, E.; Letícia Maria Bolzani Pöhls, et al |
2011 | IP Core to Leverage RTOS-Based Embedded Systems Reliability | Dhiego Silva; Fabian Vargas; Letícia Maria Bolzani Pöhls, et al |