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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12195
Type: conferenceObject
Title: Gate-level modelling of NBTI-induced delays under process variations
Author(s): COPETTI, THIAGO
MEDEIROS, GUILHERME
POEHLS, LETICIA BOLZANI
Fabian Luis Vargas
KOSTIN, SERGEI
JENIHHIN, MAKSIM
RAIK, JAAN
UBAR, RAIMUND
In: 2016 17th Latin-American Test Symposium (LATS), Brasil.
Issue Date: 2016
URI: http://hdl.handle.net/10923/12195
DOI: DOI:10.1109/latw.2016.7483343
ISBN: 9781509013319
Appears in Collections:Apresentação em Evento

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