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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/13443
Type: conferenceObject
Title: Charge sharing aware NCL gates design
Author(s): MOREIRA, MATHEUS T.
OLIVEIRA, BRUNO S.
Fernando Gehm Moraes
CALAZANS, NEY L. V.
In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2013, Estados Unidos.
Issue Date: 2013
Keywords: Reliability
Charge sharing
URI: http://hdl.handle.net/10923/13443
DOI: DOI:10.1109/dft.2013.6653608
ISBN: 9781479915859
Appears in Collections:Apresentação em Evento

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