Percorrendo por Autor ADDED, NEMITALA
Mostrando regs. 1 a 5 de 5
Data de publicação | Título | Autor(es) |
2018 | Analysis of conducted-EMI noise influence on the effectiveness of an EDAC technique to mitigate soft errors in ionizing radiation environment | GOERL, ROGER; VILLA, PAULO; Fabian Luis Vargas, et al |
2017 | Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID | VILLA, PAULO; Eduardo Bezerra; GOERL, ROGER, et al |
2016 | Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID | Juliano Benfica; GREEN, BRUNO; PORCHER, BRUNO C., et al |
2017 | Analysis of single-event upsets in a Microsemi ProAsic3E FPGA | VILLA, PAULO R. C.; GOERL, ROGER C.; Fabian Luis Vargas, et al |
2017 | Ionizing radiation effects on a COTS low-cost RISC microcontroller | LEITE, FELIPE G. H.; SANTOS, ROBERTO B. B.; MEDINA, NILBERTO H., et al |