Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12196
Type: conferenceObject
Title: Analyzing NBTI impact on SRAMs with resistive-open defects
Author(s): MARTINS, M. TULIO
MEDEIROS, G.
COPETTI, T.
Fabian Luis Vargas
POEHLS, L. BOLZANI
In: 2016 17th Latin-American Test Symposium (LATS), Brasil.
Issue Date: 2016
URI: http://hdl.handle.net/10923/12196
DOI: DOI:10.1109/latw.2016.7483345
ISBN: 9781509013319
Appears in Collections:Apresentação em Evento

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