Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12199
Type: conferenceObject
Title: Ionizing radiation effects on a COTS low-cost RISC microcontroller
Author(s): LEITE, FELIPE G. H.
SANTOS, ROBERTO B. B.
MEDINA, NILBERTO H.
AGUIAR, VITOR. A. P.
GIACOMINI, RENATO C.
ADDED, NEMITALA
AGUIRRE, FERNANDO
MACCHIONE, EDUARDO L.A.
Fabian Luis Vargas
DA SILVEIRA, MARCILEI A. G.
In: 2017 18th IEEE Latin American Test Symposium (LATS), 2017, Estados Unidos.
Issue Date: 2017
URI: http://hdl.handle.net/10923/12199
DOI: DOI:10.1109/latw.2017.7906762
ISBN: 9781538604151
Appears in Collections:Apresentação em Evento

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