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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12199
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dc.contributor.authorLEITE, FELIPE G. H.-
dc.contributor.authorSANTOS, ROBERTO B. B.-
dc.contributor.authorMEDINA, NILBERTO H.-
dc.contributor.authorAGUIAR, VITOR. A. P.-
dc.contributor.authorGIACOMINI, RENATO C.-
dc.contributor.authorADDED, NEMITALA-
dc.contributor.authorAGUIRRE, FERNANDO-
dc.contributor.authorMACCHIONE, EDUARDO L.A.-
dc.contributor.authorFabian Luis Vargas-
dc.contributor.authorDA SILVEIRA, MARCILEI A. G.-
dc.date.accessioned2018-07-19T15:07:45Z-
dc.date.available2018-07-19T15:07:45Z-
dc.date.issued2017-
dc.identifier.isbn9781538604151-
dc.identifier.urihttp://hdl.handle.net/10923/12199-
dc.language.isoen-
dc.relation.ispartof2017 18th IEEE Latin American Test Symposium (LATS), 2017, Estados Unidos.-
dc.rightsopenAccess-
dc.titleIonizing radiation effects on a COTS low-cost RISC microcontroller-
dc.typeconferenceObject-
dc.date.updated2018-07-19T15:07:45Z-
dc.identifier.doiDOI:10.1109/latw.2017.7906762-
Appears in Collections:Apresentação em Evento

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