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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12205
Type: conferenceObject
Title: An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging
Author(s): GOMEZ, ANDRES
POEHLS, LETICIA
Fabian Luis Vargas
CHAMPAC, VICTOR
In: 2015 IEEE 33rd VLSI Test Symposium (VTS), Estados Unidos.
Issue Date: 2015
URI: http://hdl.handle.net/10923/12205
DOI: DOI:10.1109/VTS.2015.7116290
ISBN: 9781479975976
Appears in Collections:Apresentação em Evento

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