| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | GOMEZ, ANDRES | - |
| dc.contributor.author | POEHLS, LETICIA | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.contributor.author | CHAMPAC, VICTOR | - |
| dc.date.accessioned | 2018-07-20T17:03:05Z | - |
| dc.date.available | 2018-07-20T17:03:05Z | - |
| dc.date.issued | 2015 | - |
| dc.identifier.isbn | 9781479975976 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12205 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2015 IEEE 33rd VLSI Test Symposium (VTS), Estados Unidos. | - |
| dc.rights | openAccess | - |
| dc.title | An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-20T17:03:04Z | - |
| dc.identifier.doi | DOI:10.1109/VTS.2015.7116290 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
