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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12270
Type: conferenceObject
Title: Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs
Author(s): LAVRATTI, F.
Letícia Maria Bolzani Pöhls
Fabian Vargas
Andrea Calimera
Enrico Macii
In: 2015 28th International Conference on VLSI Design, 2015, Brasil.
Issue Date: 2015
URI: http://hdl.handle.net/10923/12270
DOI: DOI:10.1109/VLSID.2015.74
ISBN: 9781479966585
Appears in Collections:Apresentação em Evento

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