| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | LAVRATTI, F. | - |
| dc.contributor.author | Letícia Maria Bolzani Pöhls | - |
| dc.contributor.author | Fabian Vargas | - |
| dc.contributor.author | Andrea Calimera | - |
| dc.contributor.author | Enrico Macii | - |
| dc.date.accessioned | 2018-07-30T14:41:17Z | - |
| dc.date.available | 2018-07-30T14:41:17Z | - |
| dc.date.issued | 2015 | - |
| dc.identifier.isbn | 9781479966585 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12270 | - |
| dc.language.iso | pt_BR | - |
| dc.relation.ispartof | 2015 28th International Conference on VLSI Design, 2015, Brasil. | - |
| dc.rights | openAccess | - |
| dc.title | Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-30T14:41:16Z | - |
| dc.identifier.doi | DOI:10.1109/VLSID.2015.74 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
