Please use this identifier to cite or link to this item:
https://hdl.handle.net/10923/12271
| Type: | conferenceObject |
| Title: | Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID |
| Author(s): | Juliano Benfica
GREEN, BRUNO
PORCHER, BRUNO C.
Letícia Maria Bolzani Pöhls
Fabian Vargas
MEDINA, NILBERTO H.
ADDED, NEMITALA
DE AGUIAR, VITOR A. P.
MACCHIONE, EDUARDO L. A.
AGUIRRE, FERNANDO
DA SILVEIRA, MARCILEI A. G. |
| In: | 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2016, Brasil. |
| Issue Date: | 2016 |
| URI: | http://hdl.handle.net/10923/12271 |
| DOI: | DOI:10.1109/APEMC.2016.7522900 |
| ISBN: | 9781467394949 |
| Appears in Collections: | Apresentação em Evento
|
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