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  3. Apresentação em Evento
Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/13980
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dc.contributor.authorPONTES, J.-
dc.contributor.authorNey Laert Vilar Calazans-
dc.contributor.authorPascal Vivet-
dc.date.accessioned2019-02-12T12:45:54Z-
dc.date.available2019-02-12T12:45:54Z-
dc.date.issued2012-
dc.identifier.isbn9781457721458-
dc.identifier.urihttp://hdl.handle.net/10923/13980-
dc.language.isoen-
dc.relation.ispartof2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), Alemanha.-
dc.rightsopenAccess-
dc.subjectSingle Event Upset-
dc.subjectSEU-
dc.subjectradiation hardening-
dc.subjectsoft errors-
dc.titleAn accurate Single Event Effect digital design flow for reliable system level design-
dc.typeconferenceObject-
dc.date.updated2019-02-12T12:45:54Z-
dc.identifier.doiDOI:10.1109/DATE.2012.6176466-
Appears in Collections:Apresentação em Evento

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