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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/15161
Type: conferenceObject
Title: A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects
Author(s): PINTO, G. REDIVO
MEDEIROS, G. CARDOSO
Fabian Luis Vargas
POEHLS, L. BOLZANI
In: 2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, Estados Unidos.
Issue Date: 2018
URI: http://hdl.handle.net/10923/15161
DOI: DOI:10.1109/latw.2018.8349667
ISBN: 9781538614723
Appears in Collections:Apresentação em Evento

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