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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/18146
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dc.contributor.authorRoger Goerl-
dc.contributor.authorPaulo Villa-
dc.contributor.authorFabian Luis Vargas-
dc.contributor.authorCésar Augusto Missio Marcon-
dc.contributor.authorNilberto H. Medina-
dc.contributor.authorNemitala Added-
dc.contributor.authorMarcilei da Silva-
dc.date.accessioned2021-08-31T13:46:31Z-
dc.date.available2021-08-31T13:46:31Z-
dc.date.issued2019-
dc.identifier.issn0026-2714-
dc.identifier.urihttps://hdl.handle.net/10923/18146-
dc.language.isoen-
dc.relation.ispartofMICROELECTRONICS RELIABILITY-
dc.rightsopenAccess-
dc.titleCombined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits-
dc.typeArticle-
dc.date.updated2021-08-31T13:46:29Z-
dc.identifier.doiDOI:10.1016/j.microrel.2019.06.033-
dc.jtitleMICROELECTRONICS RELIABILITY-
dc.spage113341-
dc.epage113347-
Appears in Collections:Artigo de Periódico

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