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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/20074
Type: Article
Title: Impact of radiation-induced soft error on embedded cryptography algorithms
Author(s): BANDEIRA, VITOR
SAMPFORD, JACK
Rafael Fraga Garibotti
TRINDADE, MATHEUS GARAY
BASTOS, RODRIGO POSSAMAI
REIS, RICARDO
OST, LUCIANO
In: MICROELECTRONICS RELIABILITY
Issue Date: 2021
Volume: 99
First page: 114349
URI: https://hdl.handle.net/10923/20074
DOI: DOI:10.1016/j.microrel.2021.114349
ISSN: 0026-2714
Appears in Collections:Artigo de Periódico

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