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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/21027
Type: Article
Title: Minority Carrier Lifetime Estimation by Photoconductance Decay for Silicon Wafers Immersed in HF
Author(s): Ricardo Augusto Zanotto Razera
Adriano Moehlecke
Izete Zanesco
In: IEEE Journal of Photovoltaics
Issue Date: 2017
Volume: 7
Issue: 4
First page: 1004
Last page: 1008
Keywords: Tempo de vida dos portadores de carga minoritários
Decaimento da fotocondutividade
Lâminas de silício
Tempo de imersão em HF
URI: https://hdl.handle.net/10923/21027
DOI: DOI:10.1109/JPHOTOV.2017.2706420
ISSN: 2156-3403
Appears in Collections:Artigo de Periódico

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