Visualizando por Autor MEDINA, NILBERTO H.
Mostrando reg. 1 a 5 de 5
Fecha de Publicación | Título | Autor(s) |
2018 | Analysis of conducted-EMI noise influence on the effectiveness of an EDAC technique to mitigate soft errors in ionizing radiation environment | GOERL, ROGER; VILLA, PAULO; Fabian Luis Vargas, etc. |
2016 | Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID | Juliano Benfica; GREEN, BRUNO; PORCHER, BRUNO C., etc. |
2017 | Analysis of single-event upsets in a Microsemi ProAsic3E FPGA | VILLA, PAULO R. C.; GOERL, ROGER C.; Fabian Luis Vargas, etc. |
2016 | Experimental Setups for Single Event Effect Studies | MEDINA, NILBERTO H.; Vitor Ângelo Paulino de Aguiar; Nemitala Added, etc. |
2017 | Ionizing radiation effects on a COTS low-cost RISC microcontroller | LEITE, FELIPE G. H.; SANTOS, ROBERTO B. B.; MEDINA, NILBERTO H., etc. |