| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | MARTINS, M. TULIO | - |
| dc.contributor.author | MEDEIROS, G. | - |
| dc.contributor.author | COPETTI, T. | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.contributor.author | POEHLS, L. BOLZANI | - |
| dc.date.accessioned | 2018-07-19T15:07:26Z | - |
| dc.date.available | 2018-07-19T15:07:26Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.isbn | 9781509013319 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12196 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2016 17th Latin-American Test Symposium (LATS), Brasil. | - |
| dc.rights | openAccess | - |
| dc.title | Analyzing NBTI impact on SRAMs with resistive-open defects | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-19T15:07:25Z | - |
| dc.identifier.doi | DOI:10.1109/latw.2016.7483345 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
