| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | VILLA, PAULO R. C. | - |
| dc.contributor.author | GOERL, ROGER C. | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.contributor.author | POEHLS, LETICIA B. | - |
| dc.contributor.author | MEDINA, NILBERTO H. | - |
| dc.contributor.author | ADDED, NEMITALA | - |
| dc.contributor.author | DE AGUIAR, VITOR A. P. | - |
| dc.contributor.author | MACCHIONE, EDUARDO L. A. | - |
| dc.contributor.author | AGUIRRE, FERNANDO | - |
| dc.contributor.author | DA SILVEIRA, MARCILEI A. G. | - |
| dc.contributor.author | BEZERRA, EDUARDO A. | - |
| dc.date.accessioned | 2018-07-19T15:07:32Z | - |
| dc.date.available | 2018-07-19T15:07:32Z | - |
| dc.date.issued | 2017 | - |
| dc.identifier.isbn | 9781538604151 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12197 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2017 18th IEEE Latin American Test Symposium (LATS), 2017, Estados Unidos. | - |
| dc.rights | openAccess | - |
| dc.title | Analysis of single-event upsets in a Microsemi ProAsic3E FPGA | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-19T15:07:31Z | - |
| dc.identifier.doi | DOI:10.1109/latw.2017.7906772 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
