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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12270
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dc.contributor.authorLAVRATTI, F.-
dc.contributor.authorLetícia Maria Bolzani Pöhls-
dc.contributor.authorFabian Vargas-
dc.contributor.authorAndrea Calimera-
dc.contributor.authorEnrico Macii-
dc.date.accessioned2018-07-30T14:41:17Z-
dc.date.available2018-07-30T14:41:17Z-
dc.date.issued2015-
dc.identifier.isbn9781479966585-
dc.identifier.urihttp://hdl.handle.net/10923/12270-
dc.language.isopt_BR-
dc.relation.ispartof2015 28th International Conference on VLSI Design, 2015, Brasil.-
dc.rightsopenAccess-
dc.titleEvaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs-
dc.typeconferenceObject-
dc.date.updated2018-07-30T14:41:16Z-
dc.identifier.doiDOI:10.1109/VLSID.2015.74-
Appears in Collections:Apresentação em Evento

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