Campo DC | Valor | Idioma |
dc.contributor.author | MOREIRA, MATHEUS T. | - |
dc.contributor.author | OLIVEIRA, BRUNO S. | - |
dc.contributor.author | Fernando Gehm Moraes | - |
dc.contributor.author | CALAZANS, NEY L. V. | - |
dc.date.accessioned | 2018-12-11T14:01:07Z | - |
dc.date.available | 2018-12-11T14:01:07Z | - |
dc.date.issued | 2013 | - |
dc.identifier.isbn | 9781479915859 | - |
dc.identifier.uri | http://hdl.handle.net/10923/13443 | - |
dc.language.iso | en | - |
dc.relation.ispartof | 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2013, Estados Unidos. | - |
dc.rights | openAccess | - |
dc.subject | Reliability | - |
dc.subject | Charge sharing | - |
dc.title | Charge sharing aware NCL gates design | - |
dc.type | conferenceObject | - |
dc.date.updated | 2018-12-11T14:01:06Z | - |
dc.identifier.doi | DOI:10.1109/dft.2013.6653608 | - |
Aparece nas Coleções: | Apresentação em Evento
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