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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/13499
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dc.contributor.authorAlexandre de Morais Amory-
dc.contributor.authorCristiano Lazzari-
dc.contributor.authorMarcelo Soares Lubaszewski-
dc.contributor.authorFernando Gehm Moraes-
dc.date.accessioned2018-12-17T12:10:26Z-
dc.date.available2018-12-17T12:10:26Z-
dc.date.issued2011-
dc.identifier.isbn9781450308281-
dc.identifier.urihttp://hdl.handle.net/10923/13499-
dc.language.isoen-
dc.relation.ispartofSymposium on Integrated Circuits and Systems Design, 2011, Estados Unidos.-
dc.rightsopenAccess-
dc.subjectNOC - Redes Intra-chip-
dc.subjectTest Access Mechanisms-
dc.titleEarly Estimation of Wire Length for Dedicated Test Access Mechanisms in Networks-on-Chip based SoCs-
dc.typeconferenceObject-
dc.date.updated2018-12-17T12:10:26Z-
dc.identifier.doiDOI:10.1145/2020876.2020894-
Appears in Collections:Apresentação em Evento

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