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Type: conferenceObject
Title: An accurate Single Event Effect digital design flow for reliable system level design
Author(s): PONTES, J.
Ney Laert Vilar Calazans
Pascal Vivet
In: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), Alemanha.
Issue Date: 2012
Keywords: Single Event Upset
radiation hardening
soft errors
DOI: DOI:10.1109/DATE.2012.6176466
ISBN: 9781457721458
Appears in Collections:Apresentação em Evento

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