Campo DC | Valor | Idioma |
dc.contributor.author | PINTO, G. REDIVO | - |
dc.contributor.author | MEDEIROS, G. CARDOSO | - |
dc.contributor.author | Fabian Luis Vargas | - |
dc.contributor.author | POEHLS, L. BOLZANI | - |
dc.date.accessioned | 2019-07-25T12:35:04Z | - |
dc.date.available | 2019-07-25T12:35:04Z | - |
dc.date.issued | 2018 | - |
dc.identifier.isbn | 9781538614723 | - |
dc.identifier.uri | http://hdl.handle.net/10923/15161 | - |
dc.language.iso | en | - |
dc.relation.ispartof | 2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, Estados Unidos. | - |
dc.rights | openAccess | - |
dc.title | A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects | - |
dc.type | conferenceObject | - |
dc.date.updated | 2019-07-25T12:35:03Z | - |
dc.identifier.doi | DOI:10.1109/latw.2018.8349667 | - |
Aparece nas Coleções: | Apresentação em Evento
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