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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/15161
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dc.contributor.authorPINTO, G. REDIVO-
dc.contributor.authorMEDEIROS, G. CARDOSO-
dc.contributor.authorFabian Luis Vargas-
dc.contributor.authorPOEHLS, L. BOLZANI-
dc.date.accessioned2019-07-25T12:35:04Z-
dc.date.available2019-07-25T12:35:04Z-
dc.date.issued2018-
dc.identifier.isbn9781538614723-
dc.identifier.urihttp://hdl.handle.net/10923/15161-
dc.language.isoen-
dc.relation.ispartof2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, Estados Unidos.-
dc.rightsopenAccess-
dc.titleA hardware-based approach for SEU monitoring in SRAMs with weak resistive defects-
dc.typeconferenceObject-
dc.date.updated2019-07-25T12:35:03Z-
dc.identifier.doiDOI:10.1109/latw.2018.8349667-
Appears in Collections:Apresentação em Evento

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