Campo DC | Valor | Idioma |
dc.contributor.author | MEDEIROS, G. | - |
dc.contributor.author | BRUM, E. | - |
dc.contributor.author | Letícia Maria Bolzani Pöhls | - |
dc.contributor.author | Thiago Copetti | - |
dc.contributor.author | Tiago Balen | - |
dc.date.accessioned | 2019-07-26T12:23:33Z | - |
dc.date.available | 2019-07-26T12:23:33Z | - |
dc.date.issued | 2018 | - |
dc.identifier.isbn | 9781538614723 | - |
dc.identifier.uri | http://hdl.handle.net/10923/15197 | - |
dc.language.iso | en | - |
dc.relation.ispartof | 2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, Brasil. | - |
dc.rights | openAccess | - |
dc.title | Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs | - |
dc.type | conferenceObject | - |
dc.date.updated | 2019-07-26T12:23:33Z | - |
dc.identifier.doi | DOI:10.1109/latw.2018.8349697 | - |
Aparece nas Coleções: | Apresentação em Evento
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