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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/18519
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dc.contributor.authorPEREZ, Z.-
dc.contributor.authorMESALLES, JAVIER-
dc.contributor.authorVILLACORTA, H.-
dc.contributor.authorFabian Luis Vargas-
dc.contributor.authorCHAMPAC, VICTOR-
dc.date.accessioned2021-09-24T20:49:13Z-
dc.date.available2021-09-24T20:49:13Z-
dc.date.issued2020-
dc.identifier.isbn9781728187310-
dc.identifier.urihttps://hdl.handle.net/10923/18519-
dc.language.isoen-
dc.relation.ispartof2020 IEEE Latin-American Test Symposium (LATS), 2020, Estados Unidos.-
dc.rightsopenAccess-
dc.titleAnalysis and detection of hard-to-detect full open defects in FinFET based SRAM cells-
dc.typeconferenceObject-
dc.date.updated2021-09-24T20:49:11Z-
dc.identifier.doiDOI:10.1109/LATS49555.2020.9093680-
Appears in Collections:Apresentação em Evento

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