Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/18528
Type: Article
Title: Conducted EMI susceptibility analysis of a COTS processor as function of aging
Author(s): Juliano Benfica
Fabian Luis Vargas
Matheus Fay Soares
Dorian Schramm
In: MICROELECTRONICS RELIABILITY
Issue Date: 2020
Issue: 1
First page: 113884
Last page: 1
URI: https://hdl.handle.net/10923/18528
DOI: DOI:10.1016/j.microrel.2020.113884
ISSN: 0026-2714
Appears in Collections:Artigo de Periódico

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