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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/18669
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dc.contributor.authorDA SILVA, ALZEMIRO LUCAS-
dc.contributor.authorMARTINS, ANDRÉ LUÍS DEL MESTRE-
dc.contributor.authorFernando Gehm Moraes-
dc.date.accessioned2021-10-01T19:05:19Z-
dc.date.available2021-10-01T19:05:19Z-
dc.date.issued2019-
dc.identifier.isbn9781450368445-
dc.identifier.urihttps://hdl.handle.net/10923/18669-
dc.language.isoen-
dc.relation.ispartofProceedings of the 32nd Symposium on Integrated Circuits and Systems Design - SBCCI '19, 2019, Brasil.-
dc.rightsopenAccess-
dc.subjectMonitoring-
dc.subjectMany-core-
dc.subjectTemperature-
dc.subjectResource Management-
dc.subjectDark Silicon-
dc.titleFine-grain temperature monitoring for many-core systems-
dc.typeconferenceObject-
dc.date.updated2021-10-01T19:05:18Z-
dc.identifier.doiDOI:10.1145/3338852.3339841-
Appears in Collections:Apresentação em Evento

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