Campo DC | Valor | Idioma |
dc.contributor.author | BANDEIRA, VITOR | - |
dc.contributor.author | SAMPFORD, JACK | - |
dc.contributor.author | Rafael Fraga Garibotti | - |
dc.contributor.author | TRINDADE, MATHEUS GARAY | - |
dc.contributor.author | BASTOS, RODRIGO POSSAMAI | - |
dc.contributor.author | REIS, RICARDO | - |
dc.contributor.author | OST, LUCIANO | - |
dc.date.accessioned | 2021-12-07T12:06:36Z | - |
dc.date.available | 2021-12-07T12:06:36Z | - |
dc.date.issued | 2021 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | https://hdl.handle.net/10923/20074 | - |
dc.language.iso | en | - |
dc.relation.ispartof | MICROELECTRONICS RELIABILITY | - |
dc.rights | openAccess | - |
dc.title | Impact of radiation-induced soft error on embedded cryptography algorithms | - |
dc.type | Article | - |
dc.date.updated | 2021-12-07T12:06:35Z | - |
dc.identifier.doi | DOI:10.1016/j.microrel.2021.114349 | - |
dc.jtitle | MICROELECTRONICS RELIABILITY | - |
dc.volume | 99 | - |
dc.spage | 114349 | - |
Aparece en las colecciones: | Artigo de Periódico
|