| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | SILVA, FELIPE | - |
| dc.contributor.author | SILVEIRA, JARDEL | - |
| dc.contributor.author | SILVEIRA, JARBAS | - |
| dc.contributor.author | César Augusto Missio Marcon | - |
| dc.contributor.author | VARGAS, FABIAN | - |
| dc.contributor.author | LIMA, OTÁVIO | - |
| dc.date.accessioned | 2022-11-11T19:11:30Z | - |
| dc.date.available | 2022-11-11T19:11:30Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.issn | 0923-8174 | - |
| dc.identifier.uri | https://hdl.handle.net/10923/23362 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | - |
| dc.rights | openAccess | - |
| dc.title | An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays | - |
| dc.type | Article | - |
| dc.date.updated | 2022-11-11T19:11:28Z | - |
| dc.identifier.doi | DOI:10.1007/s10836-018-5738-5 | - |
| dc.jtitle | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | - |
| dc.volume | 34 | - |
| dc.issue | 4 | - |
| dc.spage | 417 | - |
| dc.epage | 433 | - |
| Aparece en las colecciones: | Artigo de Periódico
|
