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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/23439
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dc.contributor.authorCésar Augusto Missio Marcon-
dc.contributor.authorAlexandre Amory-
dc.contributor.authorMarcelo Lubaszewski-
dc.contributor.authorAltamiro Amadeu Susin-
dc.contributor.authorNey Laert Vilar Calazans-
dc.contributor.authorFernando Gehm Moraes-
dc.contributor.authorFabiano Passuelo Hessel-
dc.date.accessioned2022-11-18T14:34:15Z-
dc.date.available2022-11-18T14:34:15Z-
dc.date.issued2004-
dc.identifier.urihttps://hdl.handle.net/10923/23439-
dc.language.isoen-
dc.relation.ispartof5th IEEE Latin-American Test Workshop, 2004, Colômbia.-
dc.rightsopenAccess-
dc.titleApplying Memory Test to Embedded Systems-
dc.typeconferenceObject-
dc.date.updated2022-11-18T14:34:14Z-
Appears in Collections:Apresentação em Evento

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