Campo DC | Valor | Idioma |
dc.contributor.author | COPETTI, THIAGO | - |
dc.contributor.author | MEDEIROS, GUILHERME | - |
dc.contributor.author | POEHLS, LETICIA BOLZANI | - |
dc.contributor.author | Fabian Luis Vargas | - |
dc.contributor.author | KOSTIN, SERGEI | - |
dc.contributor.author | JENIHHIN, MAKSIM | - |
dc.contributor.author | RAIK, JAAN | - |
dc.contributor.author | UBAR, RAIMUND | - |
dc.date.accessioned | 2018-07-19T15:07:17Z | - |
dc.date.available | 2018-07-19T15:07:17Z | - |
dc.date.issued | 2016 | - |
dc.identifier.isbn | 9781509013319 | - |
dc.identifier.uri | http://hdl.handle.net/10923/12195 | - |
dc.language.iso | en | - |
dc.relation.ispartof | 2016 17th Latin-American Test Symposium (LATS), Brasil. | - |
dc.rights | openAccess | - |
dc.title | Gate-level modelling of NBTI-induced delays under process variations | - |
dc.type | conferenceObject | - |
dc.date.updated | 2018-07-19T15:07:16Z | - |
dc.identifier.doi | DOI:10.1109/latw.2016.7483343 | - |
Aparece nas Coleções: | Apresentação em Evento
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