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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/15197
Type: conferenceObject
Title: Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs
Author(s): MEDEIROS, G.
BRUM, E.
Letícia Maria Bolzani Pöhls
Thiago Copetti
Tiago Balen
In: 2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, Brasil.
Issue Date: 2018
URI: http://hdl.handle.net/10923/15197
DOI: DOI:10.1109/latw.2018.8349697
ISBN: 9781538614723
Appears in Collections:Apresentação em Evento

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