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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/13176
Type: conferenceObject
Title: Determining the test sources/sinks for NoC TAMs
Author(s): Alexandre de Morais Amory
MORENO, EDSON
MORAES, FERNANDO
LUBASZEWSKI, MARCELO S.
In: Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2013, Brasil.
Issue Date: 2013
URI: http://hdl.handle.net/10923/13176
Appears in Collections:Apresentação em Evento

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