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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/15159
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dc.contributor.authorVILLA, PAULO-
dc.contributor.authorEduardo Bezerra-
dc.contributor.authorGOERL, ROGER-
dc.contributor.authorPOEHLS, LETICIA-
dc.contributor.authorFabian Luis Vargas-
dc.contributor.authorMEDINA, NILBERTO-
dc.contributor.authorADDED, NEMITALA-
dc.contributor.authorDE AGUIAR, VITOR-
dc.contributor.authorMACCHIONE, EDUARDO-
dc.contributor.authorAGUIRRE, FERNANDO-
dc.contributor.authorDA SILVEIRA, MARCILEI-
dc.date.accessioned2019-07-25T12:34:51Z-
dc.date.available2019-07-25T12:34:51Z-
dc.date.issued2017-
dc.identifier.isbn9781538626894-
dc.identifier.urihttp://hdl.handle.net/10923/15159-
dc.language.isoen-
dc.relation.ispartof2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo), 2017, Rússia.-
dc.rightsopenAccess-
dc.titleAnalysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID-
dc.typeconferenceObject-
dc.date.updated2019-07-25T12:34:50Z-
dc.identifier.doiDOI:10.1109/emccompo.2017.7998076-
Appears in Collections:Apresentação em Evento

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