Please use this identifier to cite or link to this item:
https://hdl.handle.net/10923/15159
| Type: | conferenceObject |
| Title: | Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID |
| Author(s): | VILLA, PAULO
Eduardo Bezerra
GOERL, ROGER
POEHLS, LETICIA
Fabian Luis Vargas
MEDINA, NILBERTO
ADDED, NEMITALA
DE AGUIAR, VITOR
MACCHIONE, EDUARDO
AGUIRRE, FERNANDO
DA SILVEIRA, MARCILEI |
| In: | 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo), 2017, Rússia. |
| Issue Date: | 2017 |
| URI: | http://hdl.handle.net/10923/15159 |
| DOI: | DOI:10.1109/emccompo.2017.7998076 |
| ISBN: | 9781538626894 |
| Appears in Collections: | Apresentação em Evento
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