| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | MEDEIROS, G. CARDOSO | - |
| dc.contributor.author | POEHLS, L. BOLZANI | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.date.accessioned | 2018-07-19T15:03:11Z | - |
| dc.date.available | 2018-07-19T15:03:11Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.isbn | 9781467387002 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12193 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), Índia. | - |
| dc.rights | openAccess | - |
| dc.title | Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-19T15:03:10Z | - |
| dc.identifier.doi | DOI:10.1109/vlsid.2016.146 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
