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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12193
Type: conferenceObject
Title: Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects
Author(s): MEDEIROS, G. CARDOSO
POEHLS, L. BOLZANI
Fabian Luis Vargas
In: 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), Índia.
Issue Date: 2016
URI: http://hdl.handle.net/10923/12193
DOI: DOI:10.1109/vlsid.2016.146
ISBN: 9781467387002
Appears in Collections:Apresentação em Evento

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