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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/18146
Type: Article
Title: Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
Author(s): Roger Goerl
Paulo Villa
Fabian Luis Vargas
César Augusto Missio Marcon
Nilberto H. Medina
Nemitala Added
Marcilei da Silva
In: MICROELECTRONICS RELIABILITY
Issue Date: 2019
First page: 113341
Last page: 113347
URI: https://hdl.handle.net/10923/18146
DOI: DOI:10.1016/j.microrel.2019.06.033
ISSN: 0026-2714
Appears in Collections:Artigo de Periódico

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